Wim J. van der Linden,

Optimal Assembly of Psychological and Educational Tests
Applied Psychological Measurement 1998 22: 195-211. [Abstract] [PDF] [References]  

Piet F. Sanders and Alfred J. Verschoor

Parallel Test Construction Using Classical Item Parameters
Applied Psychological Measurement 1998 22: 212-223. [Abstract] [PDF] [References]  

Richard M. Luecht

Computer-Assisted Test Assembly Using Optimization Heuristics
Applied Psychological Measurement 1998 22: 224-236. [Abstract] [PDF] [References]  

Ronald D. Armstrong, Douglas H. Jones, and Charles S. Kunce

IRT Test Assembly Using Network-Flow Programming
Applied Psychological Measurement 1998 22: 237-247. [Abstract] [PDF] [References]  

Martijn P. F. Berger

Optimal Design of Tests with Dichotomous and Polytomous Items
Applied Psychological Measurement 1998 22: 248-258. [Abstract] [PDF] [References]  

Wim J. van der Linden and Lynda M. Reese

A Model for Optimal Constrained Adaptive Testing
Applied Psychological Measurement 1998 22: 259-270. [Abstract] [PDF] [References]  

Martha L. Stocking and Len Swanson

Optimal Design of Item Banks for Computerized Adaptive Tests
Applied Psychological Measurement 1998 22: 271-279. [Abstract] [PDF] [References]  

Ellen Timminga

Solving Infeasibility Problems in Computerized Test Assembly
Applied Psychological Measurement 1998 22: 280-291. [Abstract] [PDF] [References]  

Linda F. Wightman

Practical Issues in Computerized Test Assembly
Applied Psychological Measurement 1998 22: 292-302. [Abstract] [PDF] [References]  

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