Applied Psychological Measurement

 

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Contents: March 1 2002, Volume 26, No. 1   [Index by Author]       Other Issues: Previous issue Next issue  

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To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.

Bradley A. Hanson and Anton A. Béguin

Applied Psychological Measurement 2002 26: 3-24. [Abstract] [PDF] [References]  

Seock-Ho Kim and Allan S. Cohen

Applied Psychological Measurement 2002 26: 25-41. [Abstract] [PDF] [References]  

Jürgen Rost and Claus H. Carstensen

Applied Psychological Measurement 2002 26: 42-56. [Abstract] [PDF] [References]  

Rebecca Zwick and Dorothy T. Thayer

Applied Psychological Measurement 2002 26: 57-76. [Abstract] [PDF] [References]  

Craig S. Wells, Michael J. Subkoviak, and Ronald C. Serlin

Applied Psychological Measurement 2002 26: 77-87. [Abstract] [PDF] [References]  

Wilco H. M. Emons, Rob R. Meijer, and Klaas Sijtsma

Applied Psychological Measurement 2002 26: 88-108. [Abstract] [PDF] [References]  

Xiaohui Wang, Eric T. Bradlow, and Howard Wainer

Applied Psychological Measurement 2002 26: 109-128. [Abstract] [PDF] [References]  

To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.