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Applied Psychological Measurement
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Contents: December 1 2002, Volume 26, No. 4   [Index by Author] 

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To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.

R. Darrell Bock, Robert L. Brennan, and Eiji Muraki

Applied Psychological Measurement 2002 26: 364-375. [Abstract] [PDF] [References] [Request Permission]  
Chi-Keung Leung, Hua-Hua Chang, and Kit-Tai Hau

Applied Psychological Measurement 2002 26: 376-392. [Abstract] [PDF] [References] [Request Permission]  
P. W. Van Rijn, T. J. H. M. Eggen, B. T. Hemker, and P. F. Sanders

Applied Psychological Measurement 2002 26: 393-411. [Abstract] [PDF] [References] [Request Permission]  
Won-Chan Lee, Bradley A. Hanson, and Robert L. Brennan

Applied Psychological Measurement 2002 26: 412-432. [Abstract] [PDF] [References] [Request Permission]  
Denny Borsboom, Gideon J. Mellenbergh, and Jaap Van Heerden

Applied Psychological Measurement 2002 26: 433-450. [Abstract] [PDF] [References] [Request Permission]  

To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.