Applied Psychological Measurement

 

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Contents: November 1 2004, Volume 28, No. 6   [Index by Author]       Other Issues: Previous issue Next issue  

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To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.


Applied Psychological Measurement 2004 28: 383-388. [PDF]  

Matthias Von Davier and Kentaro Yamamoto

Applied Psychological Measurement 2004 28: 389-406. [Abstract] [PDF] [References]  

Nilufer Kahraman and Akihito Kamata

Applied Psychological Measurement 2004 28: 407-426. [Abstract] [PDF] [References]  

Marieke J. H. Van Onna

Applied Psychological Measurement 2004 28: 427-449. [Abstract] [PDF] [References]  

Wen-Chung Wang and Ya-Hui Su

Applied Psychological Measurement 2004 28: 450-480. [Abstract] [PDF] [References]  


Applied Psychological Measurement 2004 28: 481-483. [PDF]  

To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.