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Applied Psychological Measurement
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Contents: January 1 2005, Volume 29, No. 1   [Index by Author]       Other Issues: Previous issue Next issue  

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To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.

Yuan H. Li and William D. Schafer

Applied Psychological Measurement 2005 29: 3-25. [Abstract] [PDF] [References]  

Irene Hendrawan, Cees A. W. Glas, and Rob R. Meijer

Applied Psychological Measurement 2005 29: 26-44. [Abstract] [PDF] [References]  

Edwin J. C. G. van den Oord

Applied Psychological Measurement 2005 29: 45-64. [Abstract] [PDF] [References]  

Joseph F. Lucke

Applied Psychological Measurement 2005 29: 65-81. [Abstract] [PDF] [References]  

To see an article, click its [PDF] link. To add articles to your marked citations, check the boxes to the left of the titles you want, and click the 'Add to Marked Citations' button. To see one abstract at a time, click its [Abstract] link.